Atomic Force Microscope
Tuesday, 21. November 2017

Park XE-150

Main Features:

  • Artifact Free Imaging by Crosstalk Elimination
  • Two independent, closed-loop XY and Z flexure scanners for sample and tip
  • Flat and linear XY scan of 100 μm x 100 μm with low residual bow•
  • Out of plane motion of less than 2 nm over entire scan range
  • Up to 25 μm Z-scan by high force scanner
  • Accurate height measurements